High mobility ZnO thin film deposition on SrTiO3 and transparent field effect transistor fabrication

被引:17
作者
Bellingeri, E
Marré, D
Pellegrino, L
Pallecchi, I
Canu, G
Vignolo, M
Bernini, C
Siri, AS
机构
[1] INFM Lamia, I-16152 Genoa, Italy
[2] Univ Genoa, Dipartimento Fis, I-16146 Genoa, Italy
关键词
D O I
10.1016/j.spmi.2005.08.016
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Zinc oxide and strontium titanate are among the most interesting materials for oxide electronics due to their semiconducting and dielectric properties respectively. We obtain high electron mobility values in epitaxial ZnO thin films deposited on (110) oriented strontium titanate substrates. Values up to 400 cm(2)/V s are found below 50 K in samples grown by a two step method: firstly a thin ZnO relaxing layer is deposited on the SrTiO3 (110) substrate at relatively low temperature (550 degrees C) and then the deposition temperature is raised up to 750 degrees C for the growth of a second ZnO layer. The realized epitaxial ZnO/SrTiO3 heterostructures are used to fabricate field effect transistors transparent at visible wavelength. By conventional photolithographic techniques we realize micrometric sized devices in planar side-gate configuration. The transistors have an 80% transmittance, on-off ratios up to 10(6), and field effect mobilities up to 30 cm(2)/V S. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:446 / 454
页数:9
相关论文
共 26 条
[1]  
Azzam R.M.A., 1977, Ellipsometry and Polarized Light
[2]   Photodetecting properties of ZnO-based thin-film transistors [J].
Bae, HS ;
Yoon, MH ;
Kim, JH ;
Im, S .
APPLIED PHYSICS LETTERS, 2003, 83 (25) :5313-5315
[3]   High mobility in ZnO thin films deposited on perovskite substrates with a low temperature nucleation layer -: art. no. 012109 [J].
Bellingeri, E ;
Marré, D ;
Pallecchi, I ;
Pellegrino, L ;
Siri, AS .
APPLIED PHYSICS LETTERS, 2005, 86 (01) :012109-1
[4]  
BELLINGERI E, UNPUB J APPL PHYS, P23807
[5]   High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer [J].
Chiang, HQ ;
Wager, JF ;
Hoffman, RL ;
Jeong, J ;
Keszler, DA .
APPLIED PHYSICS LETTERS, 2005, 86 (01) :013503-1
[6]  
Herzinger C. M., 1998, U.S. patent, Patent No. [5,796,983, 5796983]
[7]   ZnO-based transparent thin-film transistors [J].
Hoffman, RL ;
Norris, BJ ;
Wager, JF .
APPLIED PHYSICS LETTERS, 2003, 82 (05) :733-735
[8]   Optical functions of uniaxial ZnO determined by generalized ellipsometry [J].
Jellison, GE ;
Boatner, LA .
PHYSICAL REVIEW B, 1998, 58 (07) :3586-3589
[9]   OPTICAL FUNCTIONS AND TRANSPARENT THIN-FILMS OF SRTIO3, BATIO3, AND SIOX DETERMINED BY SPECTROSCOPIC ELLIPSOMETRY [J].
JELLISON, GE ;
BOATNER, LA ;
LOWNDES, DH ;
MCKEE, RA ;
GODBOLE, M .
APPLIED OPTICS, 1994, 33 (25) :6053-6058
[10]   Dependence of carrier doping level on the photo control of (La, Sr)MnO3/SrTiO3 functional heterojunction [J].
Katsu, H ;
Tanaka, H ;
Kawai, T .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (09) :4578-4582