Spectral analysis method for deriving RBS-like carbon spectra from the 12C(α, α)12C resonant reaction

被引:4
作者
Driemeier, C. [1 ]
Baumvol, I. J. R. [1 ,2 ]
机构
[1] Univ Fed Rio Grande do Sul, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil
[2] Univ Caxias Sul, CCET, BR-95070560 Caxias Do Sul, Brazil
关键词
carbon; nuclear reaction analysis; thin films;
D O I
10.1016/j.nimb.2008.03.050
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This article presents a spectral analysis method that detects C using the high-sensitivity of the 4.26 MeV resonance of the C-12(alpha, alpha)C-12 nuclear reaction while avoiding issues arising from the peaky and asymmetric resonance shape, which complicates depth-sensitive C analysis. By averaging nuclear reaction spectra taken with a set of conveniently chosen He beam energies, we obtain C spectra with amplified intensity, but shape similar to Rutherford backscattering spectrometry (RBS) spectra. The latter fact allows intuitive reading of underlying C depth profiles without employing spectrum simulation software. The method was first applied to simulated samples whose nuclear reaction spectra were generated by SIMNRA, which allowed checking for method accuracy by comparison to corresponding simulated RBS spectra. As real examples of the method application, it was applied to detect depth-sensitive C signals from SiC substrates covered by SiO2 layers and from 50 nm. hafnium-based films deposited on Si by metal-organic chemical vapor deposition. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:2041 / 2046
页数:6
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