On the use of decision tree induction for discovery of interactions in a photolithographic process

被引:20
作者
Braha, D [1 ]
Shmilovici, A
机构
[1] Ben Gurion Univ Negev, Sch Ind Engn & Management, IL-84105 Beer Sheva, Israel
[2] Ben Gurion Univ Negev, Dept Informat Syst Engn, IL-84105 Beer Sheva, Israel
关键词
aata mining; decision tree induction; photolithography; semiconductor process control; yield management;
D O I
10.1109/TSM.2003.818959
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper delineates a comprehensive and successful application of decision tree induction to 1054 records of production lots taken from a lithographic process with 45 processing steps. Complex interaction effects among manufacturing equipment that lead to increased product variability have been detected. The extracted information has been confirmed by the process engineers, and used to improve the lithographic process. The paper suggests that decision tree induction may be particularly useful when data is multidimensional, and the various process parameters and machinery exhibit highly complex interactions. Another implication is that on-line monitoring of the manufacturing process (e.g., closed-loop critical dimensions control) using data mining may be highly effective.
引用
收藏
页码:644 / 652
页数:9
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