Reliability study on high power 638-nm triple emitter broad area laser diode

被引：6

作者：

Yagi, T. ^{[1
]}

Kuramoto, K. ^{[1
]}

Kadoiwa, K. ^{[1
]}

Wakamatsu, R. ^{[1
]}

Miyashita, M. ^{[1
]}

机构：

[1] Mitsubishi Electr Corp, 4-1 Mizuhara, Itami, Hyogo 6648641, Japan

来源：

HIGH-POWER DIODE LASER TECHNOLOGY AND APPLICATIONS XIV | 2016年 / 9733卷

关键词：

red; broad area; laser diode; multi-emitter; window-mirror structure; catastrophic optical mirror degradation; high output power; reliability; mean time to failure;

D O I：

10.1117/12.2211851

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Reliabilities of the 638-nm triple emitter broad area laser diode (BA-LD) with the window-mirror structure were studied. Methodology to estimate mean time to failure (MTTF) due to catastrophic optical mirror degradation (COMD) in reasonable aging duration was newly proposed. Power at which the LD failed due to COMD (PCOMD) was measured for the aged LDs under the several aging conditions. It was revealed that the PCOMD was proportional to logarithm of aging duration, and MTTF due to COMD (MTTF(COMD)) could be estimated by using this relation. MTTF(COMD) estimated by the methodology with the aging duration of approximately 2,000 hours was consistent with that estimated by the long term aging. By using this methodology, the MTTF of the BA-LD was estimated exceeding 100,000 hours under the output of 2.5 W, duty cycles of 30%

引用

页数：11

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