Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe

被引:4
|
作者
Huang, Wei [1 ]
Dick, Andrew J. [1 ]
机构
[1] Rice Univ, Nonlinear Phenomena Lab, Dept Mech Engn & Mat Sci, Houston, TX 77005 USA
来源
JOURNAL OF COMPUTATIONAL AND NONLINEAR DYNAMICS | 2011年 / 6卷 / 04期
关键词
CANTILEVER; FREQUENCY; NANOSCALE; ADHESION; CONTACT;
D O I
10.1115/1.4003732
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
In this paper, a study of the characteristics of period-doubling bifurcations in the dynamic behavior of an atomic force microscope probe for off-resonance excitation is presented. Using a three-mode approximation and excitation at two-and-a-half times the fundamental frequency, the relationship between the characteristics of the period-doubling bifurcation and the material properties is studied by using numerical simulations. Simulations are first used to successfully reproduce nonlinear response data collected experimentally by using a commercial atomic force microscope system and then to conduct a parametric study in order to examine the influence of variations in other system parameters on the relationship. These parameters are the excitation magnitude, the damping level, the cantilever stiffness, and the characteristics of the force model. Based upon the results of the parametric study, a new operation mode for obtaining localized material properties through an efficient scanning process is proposed. A preliminary scan simulation demonstrates the successful implementation of the relationship and its potential for providing localized material property information with nanoscale resolution. [DOI: 10.1115/1.4003732]
引用
收藏
页数:9
相关论文
共 50 条
  • [1] Influence of interface phenomena on the features of interaction between the probe of atomic force microscope and soft material
    Svistkov, Alexander L.
    Izyumov, Roman I.
    MECHANICS OF MATERIALS, 2020, 148
  • [2] INFLUENCE OF INTERMOLECULAR INTERACTION FORCE ON THE JUMP MAGNITUDE OF THE ATOMIC FORCE MICROSCOPE PROBE DURING INDENTATION OF SOFT MATERIAL
    Svistkov, A. L.
    Izyumov, R. I.
    NANOSCIENCE AND TECHNOLOGY-AN INTERNATIONAL JOURNAL, 2020, 11 (01) : 55 - 71
  • [3] Analysis of nonlinear dynamic behavior of atomic force microscope using differential transformation method
    Cheng-Chi Wang
    H.-T. Yau
    Acta Mechanica, 2008, 198 : 87 - 98
  • [4] Analysis of nonlinear dynamic behavior of atomic force microscope using differential transformation method
    Wang, C. -C.
    Yau, H. -T.
    ACTA MECHANICA, 2008, 198 (1-2) : 87 - 98
  • [5] Dynamic modeling and control of an atomic force microscope probe measurement system
    Kuo, Chung-Feng Jeffrey
    Vu Quang Huy
    Chiu, Chin-Hsun
    Chiu, Shou-Feng
    JOURNAL OF VIBRATION AND CONTROL, 2012, 18 (01) : 101 - 116
  • [6] Adaptive Control of the Nonlinear Dynamic behavior of the cantilever-sample system of an Atomic Force Microscope
    Fuhrhop, Carlos
    Mercorelli, Paolo
    Quevedo, Daniel E.
    2016 IEEE INTERNATIONAL CONFERENCE ON AUTOMATICA (ICA-ACCA), 2016,
  • [7] Modeling of the Drift of Atomic-Force Microscope Probe for Local Chemical Nanodiagnostics
    Tolkach, Nikita
    Vishnyakov, Nikolai
    Vorobyov, Yuri
    Maslov, Aleksei
    2016 5TH MEDITERRANEAN CONFERENCE ON EMBEDDED COMPUTING (MECO), 2016, : 87 - 89
  • [8] Analysis of dynamic sensing of force between a probe and a vibrating sample for purposes of atomic force microscope
    Inui, N.
    SENSORS AND ACTUATORS A-PHYSICAL, 2009, 150 (02) : 224 - 230
  • [9] Effect of Improved Tracking for Atomic Force Microscope on Piezo Nonlinear Behavior
    Rana, Md. Sohel
    Pota, Hemanshu R.
    Petersen, Ian R.
    Habibullah, Habib
    ASIAN JOURNAL OF CONTROL, 2015, 17 (03) : 747 - 761
  • [10] Nonlinear behavior analysis and control of the atomic force microscope and circuit implementation
    Hsieh, Chin-Tsung
    Yau, Her-Terng
    Wang, Cheng-Chi
    Hsieh, Yi-Sheng
    JOURNAL OF LOW FREQUENCY NOISE VIBRATION AND ACTIVE CONTROL, 2019, 38 (3-4) : 1576 - 1593