Depth from structured defocus that is independent of the object reflectivity function

被引：10

作者：

Birch, Philip ^{[1
]}

Buchanan, Alastair ^{[2
]}

Young, Rupert ^{[1
]}

Chatwin, Chris ^{[1
]}

机构：

[1] Univ Sussex, Sch Engn & Design, Brighton BN1 9QT, E Sussex, England

[2] Spiral Scratch Ltd, Bromborough CH62 3PW, Merseyside, England

来源：

OPTICS LETTERS | 2011年 / 36卷 / 12期

关键词：

D O I：

10.1364/OL.36.002194

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Depth from defocus using structured light is a useful optical metrology technique since the camera and projector can be placed on the same optical axis and it can cope with depth discontinuities. However, the technique can suffer from large errors when used on surfaces with differing reflective properties. This paper demonstrates a method for overcoming this problem. (C) 2011 Optical Society of America

引用

页码：2194 / 2196

页数：3

共 4 条

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