Cryogenic sapphire oscillator with exceptionally high frequency stability

被引：41

作者：

Mann, AG ^{[1
]}

Sheng, C ^{[1
]}

Luiten, AN ^{[1
]}

机构：

[1] Univ Western Australia, Dept Phys, Nedlands, WA 6907, Australia

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 02期

基金：

澳大利亚研究理事会;

关键词：

cryogenic electronics; dielectric resonators; frequency measurement; frequency stability; microwave oscillators; microwave resonators; oscillator stability; phase noise; sapphire;

D O I：

10.1109/19.918181

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.

引用

页码：519 / 521

页数：3

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