Simulated Characteristics of Optical Electric Field Probe

被引:1
作者
Ikenaga, Tomokazu [1 ]
Ota, Hiroyasu [1 ]
Arai, Ken Ichi [1 ]
机构
[1] Sendai Res Ctr, Natl Inst Informat & Commun Technol, Aoba Ku, Sendai, Miyagi 9893204, Japan
来源
2010 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC 2010) | 2010年
关键词
Electric field distribution; Optical electric field probe; Microstrip line; FDTD;
D O I
10.1109/ISEMC.2010.5711294
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To perform electric near-field measurements with high accuracy in the gigahertz frequency range, we are developing an optical electric field probe by employing an electrooptic crystal and a laser beam for signal transmission. In this paper, we report the results of a FDTD (Finite Difference Time Domain) simulation of the invasiveness of probes when measuring the electric field distribution above a microstrip line (MSL). The purpose is to verify the measurement accuracy and clarify the design guidelines for optical electric field probes.
引用
收藏
页码:325 / 328
页数:4
相关论文
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Suzuki E, 2004, 2004 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD 1-3, P182
[2]  
Suzuki E, 2004, IEICE T ELECTRON, VE87C, P1989
[3]  
TAKAHASHI M, 2006, IEICE T COMMUN B, V89