Simulated Characteristics of Optical Electric Field Probe

被引：1

作者：

Ikenaga, Tomokazu ^{[1
]}

Ota, Hiroyasu ^{[1
]}

Arai, Ken Ichi ^{[1
]}

机构：

[1] Sendai Res Ctr, Natl Inst Informat & Commun Technol, Aoba Ku, Sendai, Miyagi 9893204, Japan

来源：

2010 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC 2010) | 2010年

关键词：

Electric field distribution; Optical electric field probe; Microstrip line; FDTD;

D O I：

10.1109/ISEMC.2010.5711294

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

To perform electric near-field measurements with high accuracy in the gigahertz frequency range, we are developing an optical electric field probe by employing an electrooptic crystal and a laser beam for signal transmission. In this paper, we report the results of a FDTD (Finite Difference Time Domain) simulation of the invasiveness of probes when measuring the electric field distribution above a microstrip line (MSL). The purpose is to verify the measurement accuracy and clarify the design guidelines for optical electric field probes.

引用

页码：325 / 328

页数：4