On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration

被引:10
作者
Hashida, Takushi [1 ]
Nagata, Makoto [1 ]
机构
[1] Kobe Univ, Dept Comp Sci & Syst Engn, Kobe, Hyogo, Japan
来源
2010 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2010年
关键词
D O I
10.1109/VLSIC.2010.5560328
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
On-chip waveform capture exhibits the resolution of 10 ps and 200 mu V with 1024 steps, and SFDR of 63.2dB in 700-MHz signal bandwidth of interest. On-chip signal probing as well as digital waveform processing are merged in systems-on-chip (SoC) integration. An exciter is combined for on-chip derivation of LCR parasitics from oscillatory waveforms of a power delivery network that are effectively seen by SoC circuits.
引用
收藏
页码:121 / 122
页数:2
相关论文
共 4 条
[1]  
Inagaki K., 2006, S VLSI CIRC JUN, P76
[2]   An On-Chip multichannel waveform monitor for diagnosis of systems-on-a-chip integration [J].
Noguchi, Koichiro ;
Nagata, Makoto .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 15 (10) :1101-1110
[3]   70-GHz effective sampling time-base on-chip oscilloscope in CMOS [J].
Safi-Harb, Mona ;
Roberts, Gordon W. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2007, 42 (08) :1743-1757
[4]   On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits [J].
Zheng, Y ;
Shepard, KL .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2003, 11 (03) :336-344