Analog/RF Built-in-Self-Test Subsystem for a Mobile Broadcast Video Receiver in 65-nm CMOS

被引：16

作者：

Banerjee, Gaurab ^{[1
]}

Behera, Manas ^{[2
]}

Zeidan, Mohamad A. ^{[2
]}

Chen, Rick ^{[3
]}

Barnett, Kenneth ^{[4
]}

机构：

[1] Indian Inst Sci, Dept Elect Commun Engn, Bangalore 560012, Karnataka, India

[2] Qualcomm Inc, Austin, TX 78759 USA

[3] Qualcomm Inc, San Diego, CA 92121 USA

[4] Qualcomm Inc, Austin, TX 78735 USA

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2011年 / 46卷 / 09期

关键词：

Analog; BIST; built in self-test; CMOS; perturbation/correlation; RF; test cost; test time;

D O I：

10.1109/JSSC.2011.2159055

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A built-in-self-test (BIST) subsystem embedded in a 65-nm mobile broadcast video receiver is described. The subsystem is designed to perform analog and RF measurements at multiple internal nodes of the receiver. It uses a distributed network of CMOS sensors and a low bandwidth, 12-bit A/D converter to perform the measurements with a serial bus interface enabling a digital transfer of measured data to automatic test equipment (ATE). A perturbation/correlation based BIST method is described, which makes pass/fail determination on parts, resulting in significant test time and cost reduction.

引用

页码：1998 / 2008

页数：11

共 11 条

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