Efficient selection of observation points for functional tests

被引：3

作者：

Kang, Jian ^{[1
]}

Seth, Sharad C. ^{[1
]}

Chang, Yi-Shing ^{[2
]}

Gangaram, Vijay ^{[2
]}

机构：

[1] Univ Nebraska, Lincoln, NE USA

[2] Intel Corp, Santa Clara, CA 95051 USA

来源：

ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN | 2008年

关键词：

D O I：

10.1109/ISQED.2008.113

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The fault coverage of existing functional tests can be enhanced by additional observation points. For a given set of functional tests, this paper proposes an efficient fault-dropping fault simulation method for selecting a subset of observation points at a small fraction of the cost of non-fault-dropping fault simulation. Experimental results on industrial circuits demonstrate the effectiveness of the method in achieving close to optimal results in the size of the selected subset with an order of magnitude less time, without losing achievable coverage. The technique is particularly applicable to industrial designs where fault-simulation times can be prohibitively expensive, even when only a sample of faults is simulated using distributed techniques.

引用

页码：236 / +

页数：3

共 15 条

[1] Agrawal P., 1989, International Test Conference 1989. Proceedings. Meeting the Tests of Time (Cat. No.89CH2742-5), P727, DOI 10.1109/TEST.1989.82361
[2] [Anonymous], DAC 94
[3] Carbine A, 1997, INT TEST CONF P, P294
[4] Cormen T. H., 1990, INTRO ALGORITHMS
[5] Test Point Insertion that facilitates ATPG in reducing test time and data volume
Geuzebroek, MJ
van der Linden, JT
van de Goor, AJ
[J]. INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS, 2002, : 138 - 147
[6] Iyengar V. S., 1989, International Test Conference 1989. Proceedings. Meeting the Tests of Time (Cat. No.89CH2742-5), P501, DOI 10.1109/TEST.1989.82333
[7] AN OBSERVABILITY ENHANCEMENT APPROACH FOR IMPROVED TESTABILITY AND AT-SPEED TEST
RUDNICK, EM
CHICKERMANE, V
PATEL, JH
[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (08) : 1051 - 1056
[8] [No title captured]
[9] [No title captured]
[10] [No title captured]

← 1 2 →