Development of an X-ray imaging system with SOI pixel detectors

被引：15

作者：

Nishimura, Ryutaro ^{[1
]}

Arai, Yasuo ^{[2
]}

Miyoshi, Toshinobu ^{[2
]}

Hirano, Keiichi ^{[3
]}

Kishimoto, Shunji ^{[3
]}

Hashimoto, Ryo ^{[3
]}

机构：

[1] SOKENDAI, Sch High Energy Accelerator Sci, Oho 1-1, Tsukuba, Ibaraki 3050801, Japan

[2] High Energy Accelerator Res Org KEK IPNS, Inst Particle & Nucl Studies, Oho 1-1, Tsukuba, Ibaraki 3050801, Japan

[3] High Energy Accelerator Res Org KEK IMSS, Inst Mat Struct Sci, Oho 1-1, Tsukuba, Ibaraki 3050801, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2016年 / 831卷

关键词：

SOI; Pixel; Detector; DAQ; 3D CT; X-ray imaging;

D O I：

10.1016/j.nima.2016.04.036

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An X-ray imaging system employing pixel sensors in silicon-on-insulator technology is currently under development. The system consists of an SOI pixel detector (INTPIX4) and a DAQ system based on a multipurpose readout board (SEABAS2). To correct a bottleneck in the total throughput of the DAQ of the first prototype, parallel processing of the data taking and storing processes and a FIFO buffer were implemented for the new DAQ release. Due to these upgrades, the DAQ throughput was improved from 6 Hz (41 Mbps) to 90 Hz (613 Mbps). The first X-ray imaging system with the new DAQ software release was tested using 33.3 keV and 9.5 keV mono X-rays for three-dimensional computerized tomography. The results of these tests are presented. (C) 2016 Elsevier B.V. All rights reserved.

引用

页码：49 / 54

页数：6

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