Nanoscale Spin Wave Localization Using Ferromagnetic Resonance Force Microscopy

被引：40

作者：

Chia, Han-Jong ^{[1
,2
]}

Guo, Feng ^{[1
,2
]}

Belova, L. M. ^{[3
]}

McMichael, R. D. ^{[1
]}

机构：

[1] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA

[2] Univ Maryland, Maryland Nanoctr, College Pk, MD 20742 USA

[3] Royal Inst Technol, Dept Mat Sci & Engn, S-10044 Stockholm, Sweden

来源：

PHYSICAL REVIEW LETTERS | 2012年 / 108卷 / 08期

关键词：

MEMORY; MODES; LOGIC;

D O I：

10.1103/PhysRevLett.108.087206

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We use the dipolar fields from a magnetic cantilever tip to generate localized spin wave precession modes in an in-plane magnetized, thin ferromagnetic film. Multiple resonances from a series of localized modes are detected by ferromagnetic resonance force microscopy and reproduced by micromagnetic models that also reveal highly anisotropic mode profiles. Modeled scans of line defects using the lowest-frequency mode provide resolution predictions of (94.5 +/- 1.5) nm in the field direction, and (390 +/- 2) nm perpendicular to the field.

引用

页数：5

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