VSSI (X)over-bar control charts for processes with multiple assignable causes
被引:1
作者:
Lee, H. J.
论文数: 0引用数: 0
h-index: 0
机构:
Korea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South KoreaKorea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South Korea
Lee, H. J.
[1
]
Lim, T. J.
论文数: 0引用数: 0
h-index: 0
机构:
Soongsil Univ, Dept Ind & Infromat Syst Engn, Seoul, South KoreaKorea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South Korea
Lim, T. J.
[2
]
Jang, S. C.
论文数: 0引用数: 0
h-index: 0
机构:
Korea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South KoreaKorea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South Korea
Jang, S. C.
[1
]
机构:
[1] Korea Atom Energy Res Inst, Integrated Risk Assessment Ctr, Taejon, South Korea
[2] Soongsil Univ, Dept Ind & Infromat Syst Engn, Seoul, South Korea
来源:
2007 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT, VOLS 1-4
|
2007年
关键词:
ATS;
Markov chain;
multiple causes;
quality control;
VSSI control chart;
D O I:
10.1109/IEEM.2007.4419390
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
This research investigates the statistical efficiency of variable sample size and sampling interval (VSSI) (X) over bar control charts under multiple assignable causes. Algorithms for calculating the average run length (ARL) and average time to signal (ATS) of a VSSI (X) over bar control chart are proposed by employing the Markov chain method. States of a process are defined in vector forms according to the location of a control statistic and the occurrence states of the assignable causes. Initial probabilities and transition probabilities are carefully derived from the definitions of the states. Statistical properties of the proposed control chart are also investigated. Illustrative examples show that the VSSI (X) over bar control chart is superior to the VSS or VSI (X) over bar control chart as well as to the Shewhart (X) over bar control chart in a statistical sense, even under multiple assignable causes.