Development of a modular CdTe detector plane for gamma-ray burst detection below 100 keV

被引：6
作者：
Ehanno, M. [1 ]
Amoros, C. [1 ]
Barret, D. [1 ]
Lacombe, K. [1 ]
Pons, R. [1 ]
Rouaix, G. [1 ]
Gevin, O. [2 ]
Limousin, O. [2 ]
Lugiez, F. [2 ]
Bardoux, A. [3 ]
Penquer, A. [3 ]
机构：
[1] CESR, F-31028 Toulouse 04, France
[2] CEA Saclay, DSM DAPNIA Serv Astrophys, Commissariat Energie Atom, F-91191 Gif Sur Yvette, France
[3] CNES, F-31401 Toulouse 9, France
来源：
ADVANCES IN SPACE RESEARCH | 2007年 / 40卷 / 08期
关键词：
gamma-ray bursts; x-ray detectors; CdTe semiconductors; ECLAIRs; x-rays; gamma-rays; front-end electronics; ASICs;
D O I：
10.1016/j.asr.2007.02.035
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
We report on the development of an innovative CdTe detector plane (DPIX) optimized for the detection and localization of gamma-ray bursts in the X-ray band (below 100 keV). DPIX is part of an R&D program funded by the French Space Agency (CNES). DPIX builds upon the heritage of the ISGRI instrument, currently operating with great success on the ESA INTEGRAL mission. DPIX is an assembly of 200 elementary modules (XRDPIX) equipped with 32 CdTe Schottky detectors (4 x 4 mm(2), 1 mm thickness) produced by ACRORAD Co., Ltd. in Japan. These detectors offer good energy response up to 100 keV. Each XRDPIX is readout by the very low noise front-end electronics chip IDeF-X, currently under development at CEA/DSM/DAPNIA. In this paper, we describe the design of XRDPIX, the main features of the IDeF-X chip, and will present preliminary results of the reading out of one CdTe Schottky detector by the IDeF-X V1.0 chip. A low-energy threshold around 2.7 keV has been measured. This is to be compared with the 12-15 keV threshold of the ISGRI-INTEGRAL and BAT-SWIFT instruments, which both use similar bulk detector material. (c) 2007 COSPAR. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：1259 / 1262
页数：4
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