Simulation optimization of single-shot continuously time-resolved MeV ultra-fast electron diffraction

被引：1

作者：

Li, Renkai ^{[1
]}

Huang, Wenhui ^{[1
]}

Du, Yingchao ^{[1
]}

Shi, Jiaru ^{[1
]}

Tang, Chuanxiang ^{[1
]}

机构：

[1] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 637卷

基金：

中国国家自然科学基金;

关键词：

MeV ultra-fast electron diffraction; Continuously time-resolved; Photocathode RF gun; RF streaking cavity; TEMPORAL RESOLUTION; GUN;

D O I：

10.1016/j.nima.2010.02.012

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In a so-called single-shot continuously time-resolved mega-electron-volt ultra-fast electron diffraction (CUR MeV UED) system, a radio-frequency streaking cavity maps the temporally distributed diffraction features into a transverse pattern, from which structural changes within the duration of the electron pulse can be resolved continuously. Due to the high charge density of the MeV beam, such a pattern can be achieved with a single electron pulse. In this paper, we present the proposed configuration and the simulation optimization of such a system. A thin slit is used as the key element to minimize overlaps of the diffraction features when they are streaked. Using polycrystalline aluminum as the sample, we obtain a streaked pattern in which features of different lattice planes are clearly resolved. It is demonstrated that such a system can take an 'atomic movie' with a duration of a few picoseconds, and continuously distributed similar to 100-femtosecond frames, by using a single electron pulse. (C) 2010 Elsevier By. All rights reserved.

引用

页码：S15 / S19

页数：5

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