Evaluating the Resistivity-Temperature Relationship for RTDs and Other Conductors

被引:18
作者
Lacy, Fred [1 ,2 ]
机构
[1] Southern Univ, Dept Elect Engn, Baton Rouge, LA 70813 USA
[2] A&M Coll, Baton Rouge, LA 70813 USA
关键词
Callendar-van Dusen; conductivity; mean free path; resistance temperature detector (RTD); temperature sensor; PLATINUM FILMS;
D O I
10.1109/JSEN.2010.2089977
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It has long been established from experimental evidence that resistance temperature detectors (RTDs) and conductors in bulk form have an electrical resistivity that is a linear function of temperature. Although this experimental data has existed for some time, there has not been a straightforward model to explain the mechanisms leading to this relationship. In order to better understand the nature of this relationship, a microscopic model is needed so that analysis of the electrons in the material can be performed. Therefore, a theoretical framework using solid-state physics and quantum mechanics principles is presented and developed to obtain an equation for bulk conductors that relates resistivity to temperature. It is then shown that this newly developed equation produces a linear relationship for conductors and provides a very good match with experimental data obtained from platinum and nickel RTDs. Therefore, this newly developed theoretical model provides great insight into the mechanisms of experimental findings.
引用
收藏
页码:1208 / 1213
页数:6
相关论文
共 36 条
[1]  
Ashby M, 2009, NANOMATERIALS, NANOTECHNOLOGIES AND DESIGN: AN INTRODUCTION FOR ENGINEERS AND ARCHITECTS, P1
[2]   Structures and melting in infinite gold nanowires [J].
Bilalbegovic, G .
SOLID STATE COMMUNICATIONS, 2000, 115 (02) :73-76
[3]  
BURNS G, 1985, SOLID STATE PHYS, P407
[4]  
BURNS G, 1985, SOLID STATE PHYS, P243
[5]  
Burns G., 1985, SOLID STATE PHYS, P187
[6]  
Cao G., 2004, Nanostructures nanomaterials : synthesis, properties applications, P1
[7]  
CHRISTMAN JR, 1988, FUNDAMENTALS SOLID S, P252
[8]  
CHRISTMAN JR, 1988, FUNDAMENTALS SOLID S, P180
[9]  
CHRISTMAN JR, 1988, FUNDAMENTALS SOLID S, P139
[10]   Size effects in the electrical resistivity of polycrystalline nanowires [J].
Durkan, C ;
Welland, ME .
PHYSICAL REVIEW B, 2000, 61 (20) :14215-14218