Localization and characterization of simple defects in finite-sized photonic crystals

被引:22
作者
Groby, Jean-Philippe [1 ,2 ]
Lesselier, Dominique [2 ]
机构
[1] Ecole Polytech, CNRS, UMR 7641, Ctr Appl Math, F-91128 Palaiseau, France
[2] CNRS Supelec Univ Paris Sud, UMR 8506, Signaux & Syst Lab, Dept Rech & Electromagnetisme, F-91192 Gif Sur Yvette, France
关键词
D O I
10.1364/JOSAA.25.000146
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Structured materials like photonic crystals require for optimal use a high degree of precision with respect to both position and optical characteristics of their components. Here we present a simple tomographic algorithm, based on a specific Green's function together with a first-order Born approximation, which enables us to localize and characterize identical defects in finite-sized photonic crystals. This algorithm is proposed as a first step to the monitoring of such materials. Illustrative numerical results show in particular the possibility of focalization beyond the Rayleigh criterion. (c) 2007 Optical Society of America.
引用
收藏
页码:146 / 152
页数:7
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