NON-DESTRUCTIVE BROADBAND MATERIAL CHARACTERIZATION OVER THE K-BAND USING WHISPERING-GALLERY-MODE RESONATORS

被引：0
|
作者：
Kheir, Mohamed S. [1 ]
Hammad, Hany F. [1 ]
Omar, Abbas [2 ]
机构：
[1] German Univ Cairo, Fac Informat Engn & Technol, New Cairo City, Egypt
[2] Univ Magdeburg, Chair Microwave & Commun Engn, Magdeburg, Germany
来源：
2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM | 2010年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A precise technique for broadband material characterization, using a whispering-gallery-mode (WGM) resonator, is proposed. The resonant perturbation method is successfully applied for extracting both the dielectric constant and loss tangent of materials over a wide frequency band. Two experimental prototypes are fabricated and employed over the K-band where consistent results are obtained with a maximum error of +/-3.3%.
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页码：355 / +
页数：2
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