Nanoscale Optical Detector with Single-Photon and Multiphoton Sensitivity

被引：48

作者：

Bitauld, David ^{[1
]}

Marsili, Francesco ^{[1
,2
]}

Gaggero, Alessandro ^{[3
]}

Mattioli, Francesco ^{[3
]}

Leoni, Roberto ^{[3
]}

Nejad, Saeedeh Jahanmiri ^{[1
]}

Levy, Francis ^{[4
]}

Fiore, Andrea ^{[1
]}

机构：

[1] Eindhoven Univ Technol, COBRA Res Inst, NL-5600 MB Eindhoven, Netherlands

[2] Ecole Polytech Fed Lausanne, Inst Quantum Elect & Photon IPEQ, CH-1015 Lausanne, Switzerland

[3] CNR, IFN, I-00156 Rome, Italy

[4] Ecole Polytech Fed Lausanne, Inst Condensed Matter Phys, CH-1015 Lausanne, Switzerland

来源：

NANO LETTERS | 2010年 / 10卷 / 08期

基金：

瑞士国家科学基金会;

关键词：

Single-photon detectors; nanoscale detectors; nanoscale imaging; quantum imaging; FIELD; LIGHT;

D O I：

10.1021/nl101411h

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We present the first nanoscale (down to approximate to 50 x 50 nm(2)) detector displaying single-photon sensitivity and a nanosecond response. This type of nanodetector can also be operated in multiphoton mode, where the detection threshold can be set at N = 1, 2, 3, or 4 photons, thus allowing the mapping of photon number statistics on the nanoscale. Its operation principle based on that of hot-spot formation in superconducting nanowires allies the temporal resolution and sensitivity of superconducting single-photon detectors with subwavelength resolution and photon number discrimination. Such detectors can be of great interest for the study of nanophotonic devices at low temperature.

引用

页码：2977 / 2981

页数：5

共 22 条

[1]

Akamine S, 1996, APPL PHYS LETT, V68, P579, DOI 10.1063/1.116504

[2] Optical properties of superconducting nanowire single-photon detectors [J].

Anant, Vikas ;

Kerman, Andrew J. ;

Dauler, Eric A. ;

Yang, Joel K. W. ;

Rosfjord, Kristine M. ;

Berggren, Karl K. .

OPTICS EXPRESS, 2008, 16 (14) :10750-10761

[3] Probing the Magnetic Field of Light at Optical Frequencies [J].

Burresi, M. ;

van Oosten, D. ;

Kampfrath, T. ;

Schoenmaker, H. ;

Heideman, R. ;

Leinse, A. ;

Kuipers, L. .

SCIENCE, 2009, 326 (5952) :550-553

[4] Observation of Polarization Singularities at the Nanoscale [J].

Burresi, M. ;

Engelen, R. J. P. ;

Opheij, A. ;

van Oosten, D. ;

Mori, D. ;

Baba, T. ;

Kuipers, L. .

PHYSICAL REVIEW LETTERS, 2009, 102 (03)

[5]

BUSATH D, 1993, P SOC PHOTO-OPT INS, V75, P1855

[6]

Cretin B, 2007, TOP APPL PHYS, V107, P181

[7] Two-photon diffraction and quantum lithography [J].

D'Angelo, M ;

Chekhova, MV ;

Shih, Y .

PHYSICAL REVIEW LETTERS, 2001, 87 (01)

[8] NEAR-FIELD OPTOELECTRONIC DETECTOR PROBES BASED ON STANDARD SCANNING FORCE CANTILEVERS [J].

DANZEBRINK, HU ;

WILKENING, G ;

OHLSON, O .

APPLIED PHYSICS LETTERS, 1995, 67 (14) :1981-1983

[9]

DANZEBRINK HU, 1993, NEAR FIELD OPTICS, P303

[10] MICROMACHINED SUBMICROMETER PHOTODIODE FOR SCANNING PROBE MICROSCOPY [J].

DAVIS, RC ;

WILLIAMS, CC ;

NEUZIL, P .

APPLIED PHYSICS LETTERS, 1995, 66 (18) :2309-2311

← 1 2 3 →