Improvement of the sign test for finding all the DC solutions of piecewise-linear circuits

被引：0

作者：

Tadeusiewicz, M ^{[1
]}

Jagocki, M ^{[1
]}

Halgas, S ^{[1
]}

机构：

[1] Lodz Tech Univ, PL-90924 Lodz, Poland

来源：

INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 1998年 / 26卷 / 05期

关键词：

D O I：

10.1002/(SICI)1097-007X(199809/10)26:5<531::AID-CTA28>3.0.CO;2-Z

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An algorithms for finding the dc solutions of the piecewise linear circuits were proposed. The sign test to increase the number of discarded regions in the piecewise linear circuits was improved. Special attention was paid to the class of circuits containing bipolar transistors.

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收藏

页码：531 / 538

页数：8

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