Optimization modeling of the cooling stage of reflow soldering process for ball grid array package using the gray-based Taguchi method

被引:31
作者
Lau, Chun-Sean [1 ]
Abdullah, M. Z. [1 ]
Ani, F. Che [2 ]
机构
[1] Univ Sains Malaysia, Sch Mech Engn, Nibong Tebal 14300, Penang, Malaysia
[2] Celest M Sdn Bhd, Kulim, Kedah, Malaysia
关键词
FINITE-ELEMENT-ANALYSIS; RELIABILITY; DESIGN; INTERCONNECTS; SIMULATION;
D O I
10.1016/j.microrel.2012.01.006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The current paper introduces an effective numerical technique for optimization of the cooling stage of reflow soldering process. The study aims to optimize the thermal stress of a solder joint and cooling rate of a ball grid array package using the gray-based Taguchi method. The current methodology comprised numerical techniques for computational fluid modeling of the internal flow in the reflow oven coupled with the structural heat modeling at the board and package levels. The Multi-physics Code Coupling Interface (MpCCI) was used as the coupling software. Various parameters, such as printed circuit board density, cooling temperature, inlet velocity, and conveyor speed, were considered. Nine simulated experiment runs based on Taguchi L-9 orthogonal arrays were performed. The optimal parameter settings for multiple performance characteristics were determined and compared with the single performance characteristic. From the analysis of variance (ANOVA) result, the most influential factor for the multiple performance characteristics was found to be the inlet velocity. Simulated experiment results showed that the performance characteristics during the cooling stage in the reflow oven obviously improved. The new approach greatly helps in reducing soldering defects and enhances solutions to lead-free reliability issues. (C) 2012 Elsevier Ltd. All rights reserved.
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页码:1143 / 1152
页数:10
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