Effect of pH and diethyl dithiophosphate (DTP) treatment on chalcopyrite and tennantite surfaces observed using atomic force microscopy (AFM)

被引:14
作者
Petrus, Himawan T. B. M. [1 ,2 ,3 ]
Hirajima, Tsuyoshi [1 ]
Sasaki, Keiko [1 ]
Okamoto, Hideyuki
机构
[1] Kyushu Univ, Fac Engn, Fukuoka 812, Japan
[2] Kyushu Univ, Grad Sch Engn, Fukuoka 812, Japan
[3] Gadjah Mada Univ, Dept Chem Engn, Jakarta, Indonesia
关键词
Chalcopyrite; Tennantite; Diethyl dithiophosphate; Atomic force microscopy; Adhesion force; Contact angle; Flotability; SULFIDE MINERALS; ADHESION FORCES; OXIDATION; ADSORPTION; FLOATABILITY; WETTABILITY; ENARGITE; AIR;
D O I
10.1016/j.colsurfa.2011.08.015
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Atomic force microscopy (AFM) has been used to observe the morphology and surface characteristics of chalcopyrite and tennantite treated at pH 4 and 9. Mineral treated with DTP at pH 9 was also observed. It was found that new surface "islands" were formed on the minerals after these treatments. The occurrence of these islands as a product of reaction was amplified with increasing treatment time. Adhesion force measurements revealed that the formation of islands under acidic conditions (pH 4) lowered the adhesion force value compared to that under alkaline conditions (pH 9), thus rendering the surfaces of the minerals more hydrophobic. A similar tendency was observed in the adhesion force value of minerals surface-treated with DTP at pH 9. This phenomenon arose as a result of a propensity for the formation of elemental sulfur or metal-deficient sulfur-rich species at pH 4 and DTP species at pH 9. The more hydrophilic surfaces of both minerals indicated by higher values of the adhesion force after treatment at pH 9 may be attributed to the occurrence of metal hydroxide moieties. From the morphology images and adhesion force, it is apparent that the coverage of islands on the surface of a mineral determines its hydrophobicity or hydrophilicity. Moreover, it also shows the relative reactivities of the minerals, with tennantite being more reactive than chalcopyrite. Furthermore, the microscopic observation by AFM was consistent with the macroscopic observations of contact angle and flotability studies. (C) 2011 Published by Elsevier B.V.
引用
收藏
页码:266 / 273
页数:8
相关论文
共 27 条
[1]   Electrochemical and surface analytical studies of tennantite in acid solution [J].
Asbjörnsson, J ;
Kelsall, GH ;
Vaughan, DJ ;
Pattrick, RAD ;
Wincott, PL ;
Hope, GA .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2004, 570 (01) :145-152
[2]   Thin-film friction and adhesion studies using atomic force microscopy [J].
Bhushan, B ;
Dandavate, C .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (03) :1201-1210
[3]   AN X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF THE OXIDATION OF CHALCOPYRITE [J].
BUCKLEY, AN ;
WOODS, R .
AUSTRALIAN JOURNAL OF CHEMISTRY, 1984, 37 (12) :2403-2413
[4]   SELF-INDUCED FLOATABILITY OF SULFIDE MINERALS - EXAMINATION OF RECENT-EVIDENCE FOR ELEMENTAL SULFUR AS THE HYDROPHOBIC ENTITY [J].
BUCKLEY, AN ;
RILEY, KW .
SURFACE AND INTERFACE ANALYSIS, 1991, 17 (09) :655-659
[5]  
BUCKLEY AN, 1988, 16 P INT MIN PROC C, P589
[6]   Force measurements with the atomic force microscope: Technique, interpretation and applications [J].
Butt, HJ ;
Cappella, B ;
Kappl, M .
SURFACE SCIENCE REPORTS, 2005, 59 (1-6) :1-152
[7]   Measurements on hydrophobic and hydrophilic surfaces using a porous gamma alumina nanoparticle aggregate mounted on Atomic Force Microscopy cantilevers [J].
Das, Theerthankar ;
Becker, Thomas ;
Nair, Balagopal N. .
THIN SOLID FILMS, 2010, 518 (10) :2769-2774
[8]   Electrochemical oxidation of the chalcopyrite surface: an XPS and AFM study in solution at pH 4 [J].
Farquhar, ML ;
Wincott, PL ;
Wogelius, RA ;
Vaughan, DJ .
APPLIED SURFACE SCIENCE, 2003, 218 (1-4) :34-43
[9]   Separation of enargite and tennantite from non-arsenic copper sulfide minerals by selective oxidation or dissolution [J].
Fornasiero, D ;
Fullston, D ;
Li, C ;
Ralston, J .
INTERNATIONAL JOURNAL OF MINERAL PROCESSING, 2001, 61 (02) :109-119
[10]  
Fuerstenau D.W., 1957, Eng. Min. J, V158, P93