Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

被引：7
|
作者：
Sader, John E. [1 ]
Friend, James R. [2 ]
机构：
[1] Univ Melbourne, Sch Math & Stat, Melbourne, Vic 3010, Australia
[2] Univ Calif San Diego, Dept Mech & Aerosp Engn, La Jolla, CA 92093 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 05期
基金：
澳大利亚研究理事会;
关键词：
Atomic force microscopy - Uncertainty analysis - Nanocantilevers - Calibration - Springs (components);
D O I：
10.1063/1.4921192
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever's spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type. (C) 2015 AIP Publishing LLC.
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页数：2
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