Impact of nickel doping on structural, optical, electrical, and third-order NLO behavior of piperazinium L-tartrate single crystals

Slow evaporation technique was used to grow single crystals of pure and nickel (Ni)-doped piperazinium L-tartrate (PPLT). Powder crystal X-ray diffraction was used to characterize the structural properties of the grown crystals. Fourier transform infrared spectroscopy was used to determine the functional groups. In the visible band, both pure and Ni-doped PPLT crystals have low absorbance, indicating their utility in nonlinear optical (NLO) applications. PPLT crystals, both pure and Ni doped, have bandgap energies that indicate their insulating nature, indicating their utility in electronic applications. The growth pattern and dislocation density of the crystal are revealed by etching analysis. The electric field response of generated single crystals was investigated in terms of dielectric constant and dielectric loss as a function of the frequency and temperature, with the findings described. The efficiency of nickel-doped PPLT crystal is 2.86 times larger than potassium dihydrogen phosphate (KDP), whereas the efficiency of pure PPLT is 1.38 times greater than KDP, according to NLO testing measured by Kurtz powder method. Because metal ions were incorporated into the crystal lattice, the SHG efficiency of nickel-doped PPLT was somewhat improved.