Two-terminal spin-orbit torque magnetoresistive random access memory

被引:172
作者
Sato, Noriyuki [1 ]
Xue, Fen [1 ,2 ]
White, Robert M. [1 ,3 ]
Bi, Chong [1 ]
Wang, Shan X. [1 ,3 ]
机构
[1] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
[2] Tsinghua Univ, Dept Elect Engn, Beijing, Peoples R China
[3] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
基金
美国国家科学基金会;
关键词
MAGNETIZATION; FIELD;
D O I
10.1038/s41928-018-0131-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spin-transfer torque magnetoresistive random access memory (STT-MRAM) is an attractive alternative to existing random access memory technologies due to its non-volatility, fast operation and high endurance. However, STT-MRAM does have limitations, including the stochastic nature of the STT-switching and a high critical switching current, which makes it unsuitable for ultrafast operation in the nanosecond and subnanosecond regimes. Spin-orbit torque (SOT) switching, which relies on the torque generated by an in-plane current, has the potential to overcome these limitations. However, SOT-MRAM cells studied so far use a three-terminal structure to apply the in-plane current, which increases the size of the cells. Here we report a two-terminal SOT-MRAM cell based on a CoFeB/MgO magnetic tunnel junction pillar on an ultrathin and narrow Ta underlayer. In this device, in-plane and out-of-plane currents are simultaneously generated on application of a voltage, and we demonstrate that the switching mechanism is dominated by SOT.
引用
收藏
页码:508 / 511
页数:4
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