Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era

被引:12
作者
Ing, Ching-Kang [1 ]
Lai, Tze Leung [2 ]
Shen, Milan [2 ]
Tsang, KaWai [2 ]
Yu, Shu-Hui [3 ]
机构
[1] Acad Sinica, Inst Stat Sci, Taipei, Taiwan
[2] Stanford Univ, Dept Stat, Stanford, CA 94305 USA
[3] Natl Kaohsiung Univ, Inst Stat, Kaohsiung, Taiwan
基金
美国国家科学基金会;
关键词
Backward elimination; Family-wise error rate; Fault detection and diagnosis; Lasso; Multistage manufacturing process; Orthogonal greedy algorithm; Sparsity; Wafer fabrication; STATISTICAL PROCESS-CONTROL; VARIABLE-SELECTION; IDENTIFICATION; CHART;
D O I
10.1080/00401706.2016.1236755
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Motivated by applications to root-cause identification of faults in multistage manufacturing processes that involve a large number of tools or equipment at each stage, we consider multiple testing in regression models whose outputs represent the quality characteristics of a multistage manufacturing process. Because of the large number of input variables that correspond to the tools or equipments used, this falls in the framework of regression modeling in the modern era of big data. On the other hand, with quick fault detection and diagnosis followed by tool rectification, sparsity can be assumed in the regression model. We introduce a new approach to address the multiple testing problem and demonstrate its advantages over existing methods. We also illustrate its performance in an application to semiconductor wafer fabrication that motivated this development. Supplementary materials for this article are available online.
引用
收藏
页码:351 / 360
页数:10
相关论文
共 31 条
[1]  
[Anonymous], 2013, ARXIV13116238
[2]  
Billingsley P., 1968, CONVERGE PROBAB MEAS
[3]   A Least Angle Regression Control Chart for Multidimensional Data [J].
Capizzi, Giovanna ;
Masarotto, Guido .
TECHNOMETRICS, 2011, 53 (03) :285-296
[4]   Adaptive multivariate statistical process control for monitoring time-varying processes [J].
Choi, SW ;
Martin, EB ;
Morris, AJ ;
Lee, IB .
INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2006, 45 (09) :3108-3118
[5]   Sure independence screening for ultrahigh dimensional feature space [J].
Fan, Jianqing ;
Lv, Jinchi .
JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES B-STATISTICAL METHODOLOGY, 2008, 70 :849-883
[6]  
Fan JQ, 2012, J ROY STAT SOC B, V74, P37, DOI 10.1111/j.1467-9868.2011.01005.x
[7]  
Fithian W., 2015, ARXIV14102597
[8]  
G'Sell M. G., 2013, ARXIV13095352
[9]   VARIABLE SELECTION VIA GIBBS SAMPLING [J].
GEORGE, EI ;
MCCULLOCH, RE .
JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION, 1993, 88 (423) :881-889
[10]  
George EI, 1997, STAT SINICA, V7, P339