Automatic optical failure detection on large ultrasonic arrays

被引:0
|
作者
Ommen, Martin Lind [1 ]
Pedersen, Kasper Flong [1 ]
Thomsen, Erik Vilain [1 ]
机构
[1] Tech Univ Denmark, Dept Hlth Technol, Lyngby, Denmark
来源
INTERNATIONAL ULTRASONICS SYMPOSIUM (IEEE IUS 2021) | 2021年
关键词
Gigapixel; feature detection; quality control;
D O I
10.1109/IUS52206.2021.9593411
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
The search for improved resolution in super-resolution ultrasound (SRUS) imaging leads to larger ultrasound arrays and smaller elements. A current large row-column addressed (RCA) array spans approximate to 21x21 mm(2) with 190 + 190 elements separated by a kerf of 3 mu m. Increasing array dimensions and decreasing feature sizes not only makes fabrication more complex, but makes quality control more challenging. In this work, we present a method for acquiring a series of high resolution microscope images of an array, combining them to a large gigapixel mosaic, making dynamic and robust optical artefact correction, before performing automatic detection of optically visible defects on such large arrays. These in combination are meant as a tool for a first line of elimination of non-ideal arrays.
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页数:4
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