Design review of an in-situ bidirectional reflectometer

被引:1
作者
Beecroft, MT
Mattison, P
机构
来源
SCATTERING AND SURFACE ROUGHNESS | 1997年 / 3141卷
关键词
BRDF; scatter; in-situ;
D O I
10.1117/12.287795
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recently, Surface Optics Corporation has designed and manufactured a field portable bidirectional reflectometer that measures the bidirectional reflectance of samples in place without, the need to take samples into the laboratory. The instrument consists of a measurement head, power supply box, and a PC. The measurement head weighs approximately sixty pounds and it contains the source, detector, stepper motors for varying the incident and reflected angles, and a filter wheel. All of these components are software controlled for measuring the BRDF of samples from 400nm to 1100nm (VIS-NIR configuration) or 3.0 mu m to 12.0 mu m (IR configuration) at incident polar angles of 0 to 60 degrees. The detector can map the BRDF of a sample from 0 to 85 degrees polar angle and 0 to 180 degrees in azimuth. The instrument configuration will be reviewed and measured data presented on a blue krylon paint sample.
引用
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页码:196 / 208
页数:13
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