Modelling and nanoscale force spectroscopy of frequency modulation atomic force microscopy

被引:5
作者
Payam, Amir Farokh [1 ]
机构
[1] Ulster Univ, Sch Engn, Newtownabbey BT37 0QB, North Ireland
关键词
Amplitude; Dissipation; Frequency modulation AFM; Phase; Slow time varying function; Virial; TIP MASS; TRANSIENT; ENERGY; AFM; SENSITIVITY; CANTILEVER; RESOLUTION; ACCURATE; FORMULAS;
D O I
10.1016/j.apm.2019.10.051
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, a simulation model for frequency modulation atomic force microscopy (FMAFM) operating in constant amplitude dynamic mode is presented. The model is based on the slow time varying function theory. The mathematical principles to derive the dynamical equations for the amplitude and phase of the FM-AFM cantilever-tip motion are explained and the stability and performance of its closed-loop controller to keep the amplitude at constant value and phase at 90 degrees is analysed. Then, the performance of the theoretical model is supported by comparison of numerical simulations and experiments. Furthermore, the transient behaviour of amplitude, phase and frequency shift of FM-AFM is investigated and the effect of controller gains on the transient motion is analysed. Finally, the derived FM-AFM model is used to simulate the single molecule/nanoscale force spectroscopy and study the effect of sample viscosity, stiffness and Hamaker constant on the response of FM-AFM. (C) 2019 Elsevier Inc. All rights reserved.
引用
收藏
页码:544 / 554
页数:11
相关论文
共 48 条
  • [1] How to measure energy dissipation in dynamic mode atomic force microscopy
    Anczykowski, B
    Gotsmann, B
    Fuchs, H
    Cleveland, JP
    Elings, VB
    [J]. APPLIED SURFACE SCIENCE, 1999, 140 (3-4) : 376 - 382
  • [2] [Anonymous], JEOL NEWS
  • [3] [Anonymous], THESIS
  • [4] [Anonymous], THESIS
  • [5] [Anonymous], THESIS
  • [6] Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods
    Barth, Clemens
    Foster, Adam S.
    Henry, Claude R.
    Shluger, Alexander L.
    [J]. ADVANCED MATERIALS, 2011, 23 (04) : 477 - 501
  • [7] Bhushan B., 2004, Handbook of Nanotechnology
  • [8] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [9] Bueno AM, 2011, CHAOTIC MODEL SIMULA, V1, P173
  • [10] Phase-Locked loops lock-in range in Frequency Modulated-Atomic Force Microscope nonlinear control system
    Bueno, Atila Madureira
    Balthazar, Jose Manoel
    Castilho Piqueira, Jose Roberto
    [J]. COMMUNICATIONS IN NONLINEAR SCIENCE AND NUMERICAL SIMULATION, 2012, 17 (07) : 3101 - 3111