Multiphoton ionization of atoms with soft x-ray pulses

被引：34

作者：

Richter, M. ^{[1
]}

Bobashev, S. V. ^{[2
]}

Sorokin, A. A. ^{[1
,2
,3
]}

Tiedtke, K. ^{[3
]}

机构：

[1] Physikalisch Tech Bundesanstalt, D-10587 Berlin, Germany

[2] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia

[3] Deutsches Elektronen Synchrotron, D-22603 Hamburg, Germany

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2010年 / 43卷 / 19期

关键词：

FREE-ELECTRON LASER; EXTREME-ULTRAVIOLET; RADIATION; FLASH; POWER; EUV;

D O I：

10.1088/0953-4075/43/19/194005

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The new soft x-ray free-electron laser in Hamburg (FLASH) has opened the doorway to totally new experiments of materials research on nanometre and femtosecond scales. However, the mechanisms of photon-matter interaction are not well understood under the conditions of ultra-high photon intensities in conjunction with short wavelengths. In this context, we have quantitatively investigated nonlinear photoionization of rare gas atoms at FLASH by ion mass-to-charge spectroscopy and, thus, also the limits for the application of gas-ionization detectors for the characterization of x-ray lasers. By strong beam focusing, we have achieved irradiance levels beyond 10(13) W cm(-2) at about 40 eV photon energy and up to 10(16) W cm(-2) in the extreme ultraviolet at about 90 eV. Here, surprisingly high degrees of photoionization were observed on Xe atoms. By comparison with other rare gas targets, it emerged that the excitation of inner-shell resonances might play a significant role in the degree of atomic perturbation by the radiation field.

引用

页数：8

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