Function-Inherent Code checking:: A new low cost on-line testing approach for high performance microprocessor control logic

被引:16
作者
Metra, C. [1 ]
Rossi, D. [1 ]
Omana, M. [1 ]
Jas, A. [2 ]
Galivanche, R. [3 ]
机构
[1] Univ Bologna, DEIS, I-40126 Bologna, Italy
[2] Intel Corp, Austin, TX USA
[3] Intel Corp, Santa Clara, CA USA
来源
PROCEEDINGS OF THE 13TH IEEE EUROPEAN TEST SYMPOSIUM: ETS 2008 | 2008年
关键词
D O I
10.1109/ETS.2008.24
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose an on-line testing approach for the control logic of high performance microprocessors. Rather than adding information redundancy (in the form of error detecting codes), we propose to look for the information redundancy (referred to as Function Inherent Codes) that the microprocessor control logic may inherently have, due to its required functionality. We will show that this allows to achieve on-line testing at significant savings in terms of area and power consumption, and with lower or comparable impact on system performance and design costs, compared to alternate, traditional on-line testing approaches.
引用
收藏
页码:171 / +
页数:2
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