Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

被引：13

作者：

Brown, H. G. ^{[1
,5
]}

Ishikawa, R. ^{[2
]}

S'anchez-Santolino, G. ^{[2
,3
]}

Shibata, N. ^{[2
]}

Ikuhara, Y. ^{[2
]}

Allen, L. J. ^{[4
]}

Findlay, S. D. ^{[1
]}

机构：

[1] Monash Univ, Sch Phys & Astron, Clayton, Vic 3800, Australia

[2] Univ Tokyo, Sch Engn, Inst Engn Innovat, Tokyo 1138656, Japan

[3] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain

[4] Univ Melbourne, Sch Phys, Parkville, Vic 3010, Australia

[5] Natl Ctr Electron Microscopy, Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA

来源：

ULTRAMICROSCOPY | 2019年 / 197卷

关键词：

Ptychography; Differential phase contrast; Scanning transmission electron microscopy; PHASE OBJECT APPROXIMATION; CONTRAST MICROSCOPY; STEM; DETECTOR; SPECIMENS; FIELDS;

D O I：

10.1016/j.ultramic.2018.12.010

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Most reconstructions of the electrostatic potential of a specimen at atomic resolution assume a thin and weakly scattering sample, restricting accurate quantification to specimens only tens of Angstroms thick. We demonstrate that using large-angle-illumination scanning transmission electron microscopy (STEM)-a probe forming aperture with convergence angle larger than about 50 mrad-allows us to better meet the weak phase object approximation and thereby accurately reconstruct the electrostatic potential in samples thicker than the order of 100 angstrom.

引用

页码：112 / 121

页数：10

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