A matter of scale: from far-field microscopy to near-field nanoscopy

被引:21
|
作者
Schmidt, Diedrich A. [1 ]
Kopf, Ilona [1 ]
Bruendermann, Erik [1 ,2 ]
机构
[1] Ruhr Univ Bochum, D-44780 Bochum, Germany
[2] Shizuoka Univ, Grad Sch Sci & Technol, Dept Nanovis Technol, Hamamatsu, Shizuoka 4328011, Japan
关键词
Microscopy; nanoscopy; infrared spectroscopy; Raman; TERS; SNOM; SNIM; Fourier transform spectroscopy; synchrotron microspectroscopy; ENHANCED RAMAN-SPECTROSCOPY; WALLED CARBON NANOTUBES; LABEL-FREE DETECTION; SCATTERING MICROSCOPY; OPTICAL MICROSCOPY; GOLD TIPS; FTIR-MICROSPECTROSCOPY; SEMICONDUCTOR SURFACE; DIFFRACTION LIMIT; LIVING CELLS;
D O I
10.1002/lpor.201000037
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Vibrational spectroscopy is a powerful analytical tool which provides chemical information about a sample without a priori knowledge. By combining vibrational spectroscopy with different microscopic techniques, scientists can visualize and characterize the chemical composition of a sample on length scales which cover many orders of magnitude; from far-field radiation used in microwave astronomy and Fourier transform infrared microscopy, to near-field scattering used in tip-enhanced Raman spectroscopy and scanning near-field optical or infrared microscopy. Here, various modern chemical mapping techniques are reviewed and their advantages and disadvantages are discussed. Also, a basic theoretical background is provided for each technique along with several illustrative examples.
引用
收藏
页码:296 / 332
页数:37
相关论文
共 50 条
  • [1] Superresolution microscopy in far-field by near-field optical random mapping nanoscopy
    Miklyaev, Yu. V.
    Asselborn, S. A.
    Zaytsev, K. A.
    Darscht, M. Ya.
    APPLIED PHYSICS LETTERS, 2014, 105 (11)
  • [2] Matter-wave interferometry from near-field to far-field diffraction
    Srisuphaphon, S.
    Temnuch, W.
    Buathong, S.
    Deachapunya, S.
    SIAM PHYSICS CONGRESS 2019 (SPC2019): PHYSICS BEYOND DISRUPTION SOCIETY, 2019, 1380
  • [3] THE NEAR-FIELD TO FAR-FIELD TRANSFORMATION
    MONK, P
    COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING, 1995, 14 (01) : 41 - 56
  • [4] Simultaneous near-field and far-field fluorescence microscopy of single molecules
    Ruckstuhl, Thomas
    Verdes, Dorinel
    Winterflood, Christian M.
    Seeger, Stefan
    OPTICS EXPRESS, 2011, 19 (07): : 6836 - 6844
  • [5] SCANNING NEAR-FIELD AND FAR-FIELD MICROSCOPY FOR THE MEASUREMENT OF SUBMICROMETER STRUCTURES
    GEUTHER, H
    SCHRODER, KP
    DANZEBRINK, HU
    MIRANDE, W
    TECHNISCHES MESSEN, 1994, 61 (10): : 390 - 400
  • [6] Photon-Induced Far-Field and Near-Field Electron Microscopy
    Wang, Kangpeng
    Vanacore, Giovanni Maria
    Pomarico, Enrico
    Madan, Ivan
    Berruto, Gabriele
    Garcia de Abajo, Francisco Javier
    Kaminer, Ido
    Carbone, Fabrizio
    2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2018,
  • [7] Far-field and near-field dispersive waves
    Noblesse, F.
    Chen, X.-B.
    Ship Technology Research, 1997, 44 (01): : 37 - 43
  • [8] Near-field imaging with far-field data
    Bao, Gang
    Li, Peijun
    Wang, Yuliang
    APPLIED MATHEMATICS LETTERS, 2016, 60 : 36 - 42
  • [9] Far-field prediction method from near-field measurement
    Sasabe, K
    Bullivant, A
    Duerr, JH
    Yoshida, K
    ELECTROMAGNETIC COMPATIBILITY 1996 - THIRTEENTH INTERNATIONAL WROCLAW SYMPOSIUM, 1996, : 445 - 449
  • [10] Far-field optical nanoscopy
    Hell, Stefan W.
    SCIENCE, 2007, 316 (5828) : 1153 - 1158