Nanoscale probing of transient carrier dynamics modulated in a GaAs-PIN junction by laser-combined scanning tunneling microscopy

被引：26

作者：

Yoshida, Shoji ^{[1
]}

Terada, Yasuhiko ^{[1
]}

Oshima, Ryuji ^{[1
]}

Takeuchi, Osamu ^{[1
]}

Shigekawa, Hidemi ^{[1
]}

机构：

[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan

来源：

NANOSCALE | 2012年 / 4卷 / 03期

关键词：

LOW-TEMPERATURE; SEMICONDUCTORS; SPECTROSCOPY; RESOLUTION; RANGE;

D O I：

10.1039/c2nr11551d

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The modulation of carrier dynamics in a GaAs-PIN junction after photoexcitation by an ultrashort-pulse laser was probed by shaken-pulse-pair-excited scanning tunneling microscopy (SPPX-STM), which enables nanoscale mapping of time-resolved STM images. The effect of the built-in potential on the carrier dynamics, diffusion and drift, which cannot be probed by the optical pump-probe technique, was successfully visualized in real space.

引用

页码：757 / 761

页数：5

共 32 条

[1] Advances in ultrafast scanning tunneling microscopy [J].

Botkin, D ;

Glass, J ;

Chemla, DS ;

Ogletree, DF ;

Salmeron, M ;

Weiss, S .

APPLIED PHYSICS LETTERS, 1996, 69 (09) :1321-1323

[2] Photoassisted scanning tunneling microscopy [J].

Grafström, S .

JOURNAL OF APPLIED PHYSICS, 2002, 91 (04) :1717-1753

[3] The capacitive origin of the picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope [J].

Groeneveld, RHM ;

vanKempen, H .

APPLIED PHYSICS LETTERS, 1996, 69 (15) :2294-2296

[4]

Hamers R., 1990, J VAC SCI TECHNOL B, V9, P514

[5] ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPIES [J].

HAMERS, RJ ;

CAHILL, DG .

APPLIED PHYSICS LETTERS, 1990, 57 (19) :2031-2033

[6] Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces [J].

Keil, UD ;

Jensen, JR ;

Hvam, JM .

APPLIED PHYSICS LETTERS, 1998, 72 (13) :1644-1646

[7] Radio-frequency scanning tunnelling microscopy [J].

Kemiktarak, U. ;

Ndukum, T. ;

Schwab, K. C. ;

Ekinci, K. L. .

NATURE, 2007, 450 (7166) :85-+

[8]

Keyes BM, 1999, AIP CONF PROC, V462, P511, DOI 10.1063/1.57997

[9] Femtosecond high-field transport in compound semiconductors [J].

Leitenstorfer, A ;

Hunsche, S ;

Shah, J ;

Nuss, MC ;

Knox, WH .

PHYSICAL REVIEW B, 2000, 61 (24) :16642-16652

[10] HIGH-SPEED SCANNING-TUNNELING-MICROSCOPY - PRINCIPLES AND APPLICATIONS [J].

MAMIN, HJ ;

BIRK, H ;

WIMMER, P ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1994, 75 (01) :161-168

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