Ionisation models for nano-scale simulation

被引：0

作者：

Seo, H. ^{[1
]}

Pia, M. G. ^{[2
]}

Kim, C. H. ^{[1
]}

Saracco, P. ^{[2
]}

机构：

[1] Hanyang Univ, Dept Nucl Engn, Seoul 133791, South Korea

[2] INFN, Sez Genova, I-16146 Genoa, Italy

来源：

INTERNATIONAL CONFERENCE ON COMPUTING IN HIGH ENERGY AND NUCLEAR PHYSICS (CHEP 2010): EVENT PROCESSING | 2011年 / 331卷

关键词：

ELECTRON-IMPACT IONIZATION; ATOMIC OXYGEN; ENERGY-LOSS; IMPLEMENTATION; COLLISION; TOOLKIT; DESIGN; SINGLE; MATTER; HE;

D O I：

10.1088/1742-6596/331/3/032030

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Two theory-driven models of electron ionisation cross sections, the Binary-Encounter-Bethe and the Deutsch-Mark one, have been implemented. The resulting values have been extensively validated over a large set of experimental data. The validation process also concerned the EEDL (Evaluated Electron Data Library), which is currently exploited by various Monte Carlo codes, including Geant4, to model electron interactions. The software design and physical features of the new models are reported, along with their validation results and the validation of EEDL.

引用

页数：6

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