Measurement of mechanical properties of nanometer scale polymer structures using atomic force microscope

被引:0
|
作者
Kim, Sung-Kyoung [1 ]
Shin, Min Kyoon [2 ]
Kim, Seon Jeong [2 ]
Lee, Haiwon [1 ]
机构
[1] Hanyang Univ, Dept Chem, Seoul 133791, South Korea
[2] Hanyang Univ, Dept Biomed Engn, Seoul 133791, South Korea
关键词
component; nanofiber; atomic force microscope; composite; elastic modulus;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One-dimensional nanofibers of Poly(vinyl alcohol) (PVA) were reinforced by adding biomolecular ferritin nanoparticles. The PVA/ferritin composite nanofibers with diameters around 100 nm were oriented on AFM calibration grating by a modified electrospinning method. The elastic modulus of the nanofibers was tested in three points bending by applying AFM force-curve measurement. The PVA/ferritin nanofibers revealed the enhanced elastic moduli about 2 times higher than those of pure PVA nanofibers. It is suggested that the enhancement of the elastic modulus by ferritin is attributed to hydrogen bondings formed between the peptide chains of the ferritin shell and the PVA matrix. The PVA nanofibers reinforced by ferritin may be applicable to artificial muscles and actuators.
引用
收藏
页码:374 / +
页数:2
相关论文
共 50 条
  • [31] Nanometer-scale scratching on the single-crystal silicon surface using an atomic force microscope
    Ichida, Y
    Takahashi, K
    ABRASIVE TECHNOLOGY: CURRENT DEVELOPMENT AND APPLICATIONS I, 1999, : 421 - 426
  • [32] Nanometer-Scale Elastic Modulus of Surfaces and Thin Films determined using an Atomic Force Microscope
    Li, Alex G.
    Burggraf, Larry W.
    Phillips, David M.
    2009 IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE, 2009, : 104 - +
  • [33] Nanometer scale characterization of polymer films by atomic-force microscopy
    Teichert, C
    Haas, A
    Wallner, GM
    Lang, RW
    MACROMOLECULAR SYMPOSIA, 2002, 181 : 457 - 466
  • [34] MECHANICAL PROPERTIES OF SURFACES STUDIED BY ATOMIC FORCE MICROSCOPE
    Matija, Lidija
    Kojic, Dusan
    Petrov, Ljubisa
    Koruga, Duro
    25TH DANUBIA-ADRIA SYMPOSIUM ON ADVANCES IN EXPERIMENTAL MECHANICS, 2008, : 169 - 170
  • [35] Estimating mechanical properties by indentation with the atomic force microscope
    Costa, KD
    Yin, FCP
    BIOPHYSICAL JOURNAL, 1999, 76 (01) : A264 - A264
  • [36] Application of atomic force Microscopy on the nanometer scale surface roughness measurement
    Han, Xianwu
    Chen, Xiao'an
    Yang, Xueheng
    Bai, Haihui
    Li, Zhiqiang
    Su, Xiaoping
    2006 1ST IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, 2006, : 131 - 135
  • [37] Nanometer scale surface properties of supported lipid bilayers measured with hydrophobic and hydrophilic atomic force microscope probes
    Schneider, J
    Barger, W
    Lee, GU
    LANGMUIR, 2003, 19 (05) : 1899 - 1907
  • [38] MEASUREMENT OF MICROMECHANICAL PROPERTIES USING A BIDIRECTIONAL ATOMIC FORCE MICROSCOPE WITH CAPACITATIVE DETECTION
    NEUBAUER, G
    COHEN, SR
    MCCLELLAND, GM
    INTERFACES BETWEEN POLYMERS, METALS, AND CERAMICS, 1989, 153 : 307 - 316
  • [39] IMAGING NANOMETER SCALE DEFECTS IN LANGMUIR-BLODGETT-FILMS WITH THE ATOMIC FORCE MICROSCOPE
    HANSMA, HG
    GOULD, SAC
    HANSMA, PK
    GAUB, HE
    LONGO, ML
    ZASADZINSKI, JAN
    LANGMUIR, 1991, 7 (06) : 1051 - 1054
  • [40] Nanometer scale conductance change in a Langmuir-Blodgett film with the atomic force microscope
    Yano, K
    Kyogaku, M
    Kuroda, R
    Shimada, Y
    Shido, S
    Matsuda, H
    Takimoto, K
    Albrecht, O
    Eguchi, K
    Nakagiri, T
    APPLIED PHYSICS LETTERS, 1996, 68 (02) : 188 - 190