Emission limited electrostatic atomization and the fine structure constant

被引:0
|
作者
Kelly, AJ [1 ]
机构
[1] ZYW Corp, Princeton Jct, NJ 08550 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2005年 / 23卷 / 04期
关键词
D O I
10.1116/1.1990123
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quadrupole mass spectrometer measurements of charged Octoil sprays reveal that operation in what is interpreted to be the emission limited regime is accurately represented by Z=exp(epsilon 0/epsilon-r(s)/f), where: Z is the fraction of the emission limited charge level, t, the coupling parameter, and f the inverse fine structure constant (137.04). The coupling parameter, defined as 1/(a(0) root pi n), where a(0) is the first Bohr radius, and n the surface charge density (m(-2)), is a nondimensional measure of intercharge spacing, and a fundamental descriptor of two-dimensional (2D) electron structures. The appearance of the coupling parameter, and the fine structure constant as empirical correlating constants for the data implies that the surface 2D electrons are in a gaseous or liquid state. This is consistent with the view that the emission limit-Rayleigh limit transition reflects a phase change of the 2D surface electron cloud from a gas/liquid to a crystalline state. For Octoil, the data indicate that this transition occurs when spray droplet radii are about 0.9 mu m. This corresponds to emission field strength of 0.13 GV/m. Bimodal droplet size distributions characterized by approximately fixed energy levels of one and two Rydbergs [1 Rydberg (Ry) = 13.6 eV], and noncontinuous charging behavior is observed. In all instances studied,. surface charge energy levels are high, and are conveniently ordered in terms of the Rydberg. (c) 2005 American Vacuum Society.
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页码:1645 / 1649
页数:5
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