Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon

被引：5
作者：
Kaganer, Vladimir M. [1 ]
Petrov, Ilia [2 ]
Samoylova, Liubov [2 ]
机构：
[1] Leibniz Inst Forsch Verbund Berlin eV, Paul Drude Inst Festkorperelekt, Hausvogteipl 5-7, D-10117 Berlin, Germany
[2] European XFEL GmbH, Holzkoppel 4, D-22869 Schenefeld, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷
关键词：
X-ray free-electron lasers; X-ray spectroscopy; bent crystals; diamond crystal optics; femtosecond X-ray diffraction; DIFFRACTION;
D O I：
10.1107/S2053273321003697
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters: (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, distance to a detector, and anisotropic elastic constants of the chosen crystal. The results allow the optimization of the parameters of bent-crystal spectrometers for the hard X-ray free-electron laser sources.
引用
收藏
页码：268 / 276
页数：9
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