Atomic layer deposited ZnO:Al for nanostructured silicon heterojunction solar cells

被引:33
作者
Steglich, M. [1 ]
Bingel, A. [2 ]
Jia, G. [1 ]
Falk, F. [1 ]
机构
[1] Inst Photon Technol, D-07745 Jena, Germany
[2] Fraunhofer Inst Appl Opt & Precis Engn, D-07745 Jena, Germany
关键词
Silicon heterojunction; Atomic layer deposition; ZnO:Al; Black Silicon; Nanowire; Nanostructure; OXIDE THIN-FILMS; GROWTH;
D O I
10.1016/j.solmat.2012.04.004
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
For transparent front contacts of nanostructured silicon solar cells aluminum doped zinc oxide (ZnO:Al), deposited by atomic layer deposition (ALD), is investigated. For this purpose it is crucial that the ZnO:Al layer covers the nanostructures conformally. ZnO:Al deposition at a temperature of 225 degrees C, compatible with the underlying solar cell structures, yields a resistivity of 1.2 x 10(-3) Omega cm and 85% mean optical transmittance in the VIS-NIR range (<1300 nm). The complex dielectric function of the ALD-ZnO:Al is determined by fitting optical spectra with a multi-oscillator model. An investigation of the layer structure shows a preferential growth in the c-direction of the hexagonal ZnO crystal and 100-200 nm long wedge-shaped crystallites. I-V measurements on planar ZnO:Al/a-Si:H(n/p)/c-Si(n(+)/p(+)) test structures reveal the nature of the ZnO:Al contact to both n- and p-type a-Si:H. Simple planar solar cells exhibited an excellent rectification behavior and open circuit voltages V-OC=620-640 mV. The feasibility of nanostructure silicon heterojunction solar cells is demonstrated by showing the conformal coating of deep Si nanowire structures. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:62 / 68
页数:7
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