Strong coupling in high-finesse organic semiconductor microcavities

被引：35
|
作者：
Connolly, LG
Lidzey, DG
Butté, R
Adawi, AM
Whittaker, DM
Skolnick, MS
Airey, R
机构：
[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
[2] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3TN, S Yorkshire, England
来源：
APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 26期
关键词：
D O I：
10.1063/1.1637146
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report the fabrication of high-finesse strongly coupled microcavities composed of a polystyrene film doped with the dye tetraphenyl-porphyrin zinc positioned between two high reflectivity dielectric mirrors. The bottom mirror was deposited by plasma enhanced chemical vapor deposition, and was composed of 11 lambda/4 thick (silicon oxide/silicon nitride) pairs. The organic layer was deposited on to this by spin coating. Finally, the top mirror was deposited by thermal evaporation and consisted of 12 lambda/4 thick (tellurium oxide/lithium fluoride) pairs. Such cavities are characterized by Q factors of between 440 and 620. Strong coupling was evidenced via white light reflectivity measurements. Due to the high cavity Q factor, a Rabi splitting of 135 meV at resonance was very clearly resolved. (C) 2003 American Institute of Physics.
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收藏
页码：5377 / 5379
页数：3
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