Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts

被引:3
作者
Izumi, Y [1 ]
Nagamori, H [1 ]
Kiyotaki, F [1 ]
Minato, T [1 ]
机构
[1] Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Midori Ku, Yokohama, Kanagawa 2268502, Japan
关键词
site selective; XAFS; fluorescence spectroscopy; energy resolution; active site;
D O I
10.1107/S0909049500013881
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
XAFS (X-ray absorption fine structure) spectra were measured by using the fluorescence spectrometer for the emitted X-ray from sample. The chemical shifts between Cu-0 and Cu-I and between Cr-III and Cr-VI were evaluated. Tuning the fluorescence spectrometer to each energy, the Cu-0 and Cu-I site-selective XANES for Cu/ZnO catalyst were measured. The first one was similar to the XANES of Cu metal and the second one was the 5 : 5 average of XANES for Cu-I sites + Cu metal. The population ratio of copper site of the Cu/ZnO catalyst was found to be Cu metal : Cu2O : Cu-I atomically dispersed on surface = 70(+/-23) : 22(+/-14) : 8(+/-5). Site-selective XANES for Cr-III site of Cr/SiO2 catalyst was also studied.
引用
收藏
页码:605 / 607
页数:3
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