Improving Reliability in Cell-based Evolve Hardware Architecture using Fault Tolerance Control

被引：0

作者：

Wongyai, Chanin ^{[1
]}

Nilagupta, Pradondet ^{[1
]}

机构：

[1] Kasetsart Univ, Dept Comp Engn, Bangkok, Thailand

来源：

2014 IEEE INTERNATIONAL CONFERENCE ON CONTROL SYSTEM COMPUTING AND ENGINEERING | 2014年

关键词：

Fault-tolerance; evolve hardware; reliability; self-repair;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a cell-based architecture with fault tolerance control unit. The main features of proposed model are a control unit can be used to take control over neighbor functional units when neighbor control units failed. In the approach considered a cell to be control layer and functional layer. A functional unit in the functional layer is used to perform operations of cells and support repairing and detecting faults in the control layer. A control unit in the control layer can be used to detect and repair faults in other control units in the control layer and its functional unit in the functional layer. Therefore, this strategy can take advantage of the internal resource. This paper shows how the model can be used to repair a control unit fault and a functional unit fault. The reliability analysis shows the improving fault tolerance of this model.

引用

页码：190 / 195

页数：6

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