How Few Tests Can Demonstrate the Operational Reliability of Products

被引:4
作者
Ahmed, Hussam [1 ]
Chateauneuf, Alaa [1 ]
机构
[1] Polytech Clermont Ferrand, LaMI UBP & IFMA, F-63174 Aubiere, France
来源
QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT | 2011年 / 8卷 / 04期
关键词
Bayesian approach; confidence interval; reliability demonstration tests; statistical uncertainties; test of hypothesis;
D O I
10.1080/16843703.2011.11673267
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Highly reliable industrial products impose insisted demands on manufacturers to carry out, before starting mass production, reliability demonstration tests for their new products in order to verify how they meet the reliability targets. However, due to cost and time constraints, a small number of the new products is available for testing and the reliability demonstration is not that easy, as conventional statistics cannot be directly applied. In this paper, four probabilistic approaches are discussed and compared in case of reliability demonstration with few test data. These approaches are the confidence interval, the test of hypothesis, the Bayesian approach and the compound uncertainties. The latter is proposed in this work as a robust tool for demonstration tests with small sample size.
引用
收藏
页码:411 / 428
页数:18
相关论文
共 13 条
[1]  
Benedict A. G., 1967, RELIABILITY CONFIDEN, P32
[2]  
Benjamin JR, 1970, PROBABILITY STAT DEC
[3]  
Guida M., 2002, RELIAB ENG SYST SAFE, V76, P137
[4]   Bayesian techniques to reduce the sample size in automotive electronics attribute testing [J].
Kleyner, A ;
Bhagath, S ;
Gasparini, M ;
Robinson, J ;
Bender, M .
MICROELECTRONICS AND RELIABILITY, 1997, 37 (06) :879-883
[5]  
Lalanne C., 2004, STAGE ASTE PERSONNAL
[6]  
Liu P. L., 1991, STRUCT SAF, V9, P7
[7]  
Madsen H., 1986, Methods of structural safety
[8]  
Madsen H. O., 1986, STRUCTURAL RELIABILI
[9]  
Meeker W.Q., 1998, Statistical Methods for Reliability Data
[10]  
Melchers RE., 1987, Structural reliability analysis and prediction