Characterization of Ce1-xZrxO2 thin films prepared by pyrolytic spray technique

被引:4
作者
Elidrissi, B [1 ]
Addou, M
Regragui, M
Mzerd, A
Bougrine, A
Kachouane, A
机构
[1] Fac Sci, Dept Phys, Lab Optoelect & Physicochim Mat, Kenitra, Morocco
[2] Fac Sci, Dept Phys, Phys Mat Lab, Agdal Rabat, Morocco
关键词
thin films; Ce1-xZrxO2; spray pyrolysis; characterization; counter electrode;
D O I
10.1016/S0167-2738(01)00675-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
It was demonstrated that spray pyrolysis can be used to prepare Ce1-xZrxO2 thin films with x between 0 and 1. The composition of these films was determined by electron probe microanalysis (EPMA), and the crystalline structure by X-ray diffract ion (XRD) and Raman spectroscopy (RS). Cyclic voltammetry (CV) was performed in an electrolyte of propylene carbonate with 1 M LiClO4. Films with high Zr content were incapable of charge exchange of Li+ ions. In the contrast, films with high Cc content were found to be able to insert/extract large charge densities of Li+ ions. They also remained transparent during Li+ intercalation. (C) 2001 Elsevier Science B.V. Ali rights reserved.
引用
收藏
页码:369 / 374
页数:6
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