Influence of oxygen gas content on the structural and optical properties of ZnO thin films deposited by RF magnetron sputtering at room temperature

被引:11
作者
Liu Baoting [1 ]
Zhou Yang [1 ]
Zheng Hongfang [2 ]
Li Man [1 ]
Guo Zhe [1 ]
Zhao Qingxun [1 ]
Peng Yingcai [3 ]
机构
[1] Hebei Univ, Coll Phys Sci & Technol, Baoding 071002, Peoples R China
[2] Baoding Univ, Baoding 071000, Peoples R China
[3] Hebei Univ, Coll Elect & Informat Engn, Baoding 071002, Peoples R China
基金
高等学校博士学科点专项科研基金; 中国国家自然科学基金;
关键词
thin films; zinc oxide; magnetron sputtering; oxygen; structural properties; optical properties; GROWTH;
D O I
10.1007/s12598-011-0219-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Zinc oxide (ZnO) thin films were deposited on sapphire (0001) substrates at room temperature by radiofrequency (RF) magnetron sputtering at oxygen gas contents of 0%, 25%, 50% and 75%, respectively. The influence of oxygen gas content on the structural and optical properties of ZnO thin films was studied by a surface profile measuring system, X-ray diffraction analysis, atomic force microscopy, and UV spectro-photometry. It is found that the size of ZnO crystalline grains increases first and then decreases with the increase of oxygen gas content, and the maximum grain size locates at the 25% oxygen gas content. The crystalline quality and average optical transmittance (>90%) in the visible-light region of the ZnO film prepared at an oxygen gas content of 25% are better than those of ZnO films at the other contents. The obtained results can be attributed to the resputtering by energetic oxygen anions in the growing process.
引用
收藏
页码:170 / 174
页数:5
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