Time-resolved morphological study of bulk heterojunction films for efficient organic solar devices

被引：30

作者：

Paci, B. ^{[1
]}

Generosi, A. ^{[1
]}

Albertini, V. Rossi ^{[1
]}

Generosi, R. ^{[1
]}

Perfetti, P. ^{[1
]}

de Bettignies, R. ^{[2
]}

Sentein, C. ^{[3
]}

机构：

[1] CNR, Ist Struttura Mat, I-00133 Rome, Italy

[2] Lab Composants Solaires CEA INES RDI, F-73377 Le Bourget Du Lac, France

[3] CEA Saclay, DRT LITEN DSEN GENEC L2C, F-91191 Gif Sur Yvette, France

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2008年 / 112卷 / 26期

关键词：

D O I：

10.1021/jp801674v

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The crucial requirement of device stability in the development of organic electronics was addressed. In particular, the nanoscale morphology of bulk heterojunction organic films for photovoltaic applications was studied by time-resolved energy dispersive X-ray reflectometry in synergy with atomic force microscopy analysis. A reorganization of the organic molecules in the film upon illumination was detected. The occurrence of two distinct processes (characterized by a reorganization of the blend bulk and an increase of its surface roughness, respectively) was revealed. Furthermore, the effect of the morphological instability on the device efficiency over time was quantified. Finally, the effect of thermal annealing treatments and of the choice of different cathodes was verified.

引用

页码：9931 / 9936

页数：6

共 21 条

[1] Energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices [J].