binary regression model;
misclassification;
random effects;
Bayesian inference;
Markov chain;
Monte Carlo methods;
D O I:
10.1016/j.csda.2004.07.004
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
A Bayesian analysis for a random effect binary logistic regression model in the presence of misclassified data is considered. The introduction of a random effect captures the possible correlation among the binary data in each covariate pattern and hence may provide a good alternative to standard models in terms of overall fit. Markov Chain Monte Carlo methods are applied to perform the computations needed to draw inferences and make model assessment, through an illustrative example involving a real medical data set. (c) 2004 Elsevier B.V. All rights reserved.
机构:
Baylor Hlth Care Syst, Inst Hlth Care Res & Improvernent, Dallas, TX 75206 USABaylor Hlth Care Syst, Inst Hlth Care Res & Improvernent, Dallas, TX 75206 USA
Cheng, Dunlei
Stamey, James D.
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机构:Baylor Hlth Care Syst, Inst Hlth Care Res & Improvernent, Dallas, TX 75206 USA
Stamey, James D.
Branscum, Adam J.
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机构:
Univ Kentucky, Dept Biostat, Lexington, KY 40536 USA
Univ Kentucky, Dept Stat, Lexington, KY 40536 USA
Univ Kentucky, Dept Epidemiol, Lexington, KY 40536 USABaylor Hlth Care Syst, Inst Hlth Care Res & Improvernent, Dallas, TX 75206 USA
机构:
Eli Lilly & Co, Lilly Corp Ctr, Exploratory Program Med Stat, Indianapolis, IN 46285 USAEli Lilly & Co, Lilly Corp Ctr, Exploratory Program Med Stat, Indianapolis, IN 46285 USA
McGlothlin, Anna
Stamey, James D.
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机构:
Baylor Univ, Dept Stat Sci, Waco, TX 76798 USAEli Lilly & Co, Lilly Corp Ctr, Exploratory Program Med Stat, Indianapolis, IN 46285 USA
Stamey, James D.
Seaman, John W., Jr.
论文数: 0引用数: 0
h-index: 0
机构:
Baylor Univ, Dept Stat Sci, Waco, TX 76798 USAEli Lilly & Co, Lilly Corp Ctr, Exploratory Program Med Stat, Indianapolis, IN 46285 USA