Multiple-wavelength resonant fluctuation x-ray scattering

被引：3
作者：
Kurta, R. P. [1 ]
机构：
[1] European XFEL GmbH, Holzkoppel 4, D-22869 Schenefeld, Germany
来源：
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2016年 / 49卷 / 16期
关键词：
x-ray cross-correlation analysis; x-ray imaging; resonant x-ray scattering; FREE-ELECTRON LASER; PHASE RETRIEVAL; MICROSCOPY; PARTICLES;
D O I：
10.1088/0953-4075/49/16/165001
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A multiple-wavelength resonant fluctuation x-ray scattering approach is proposed for element-specific imaging of nanoscale objects in random ensembles with short positional and rotational relaxation times. It is shown, that by applying x-ray cross-correlation analysis in combination with iterative phase retrieval to the scattering data measured at multiple x-ray energies near an absorption edge of a substance, it is possible to image the nanoscale structure of an individual object with chemical sensitivity. The elemental distribution in distinct two-component model nanostructures was reconstructed using the simulated scattering data from two-dimensional random ensembles of particles. The approach might be especially advantageous for structural studies at x-ray free electron lasers.
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页数：6
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