Multiple-wavelength resonant fluctuation x-ray scattering

被引：3

作者：

Kurta, R. P. ^{[1
]}

机构：

[1] European XFEL GmbH, Holzkoppel 4, D-22869 Schenefeld, Germany

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2016年 / 49卷 / 16期

关键词：

x-ray cross-correlation analysis; x-ray imaging; resonant x-ray scattering; FREE-ELECTRON LASER; PHASE RETRIEVAL; MICROSCOPY; PARTICLES;

D O I：

10.1088/0953-4075/49/16/165001

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A multiple-wavelength resonant fluctuation x-ray scattering approach is proposed for element-specific imaging of nanoscale objects in random ensembles with short positional and rotational relaxation times. It is shown, that by applying x-ray cross-correlation analysis in combination with iterative phase retrieval to the scattering data measured at multiple x-ray energies near an absorption edge of a substance, it is possible to image the nanoscale structure of an individual object with chemical sensitivity. The elemental distribution in distinct two-component model nanostructures was reconstructed using the simulated scattering data from two-dimensional random ensembles of particles. The approach might be especially advantageous for structural studies at x-ray free electron lasers.

引用

页数：6

共 37 条

[1] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].

ADE, H ;

ZHANG, X ;

CAMERON, S ;

COSTELLO, C ;

KIRZ, J ;

WILLIAMS, S .

SCIENCE, 1992, 258 (5084) :972-975

[2] X-ray cross-correlation analysis and local symmetries of disordered systems: General theory (vol 82, 104207, 2010) [J].

Altarelli, M. ;

Kurta, R. P. ;

Vartanyants, I. A. .

PHYSICAL REVIEW B, 2012, 86 (17)

[3] X-ray cross-correlation analysis and local symmetries of disordered systems: General theory [J].

Altarelli, M. ;

Kurta, R. P. ;

Vartanyants, I. A. .

PHYSICAL REVIEW B, 2010, 82 (10)

[4]

[Anonymous], 2007, Technical Design Report DESY 2006-097

[5] Component Particle Structure in Heterogeneous Disordered Ensembles Extracted from High-Throughput Fluctuation X-Ray Scattering [J].

Chen, Gang ;

Zwart, Peter H. ;

Li, Dongsheng .

PHYSICAL REVIEW LETTERS, 2013, 110 (19)

[6] Atomic-level structure and structure-property relationship in metallic glasses [J].

Cheng, Y. Q. ;

Ma, E. .

PROGRESS IN MATERIALS SCIENCE, 2011, 56 (04) :379-473

[7] ANOMALOUS DISPERSION CALCULATIONS NEAR TO AND ON THE LONG-WAVELENGTH SIDE OF AN ABSORPTION-EDGE [J].

CROMER, DT ;

LIBERMAN, DA .

ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (MAR) :267-268

[8] Iterative phasing for fluctuation X-ray scattering [J].

Donatelli, Jeffrey J. ;

Zwart, Peter H. ;

Sethian, James A. .

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2015, 112 (33) :10286-10291

[9] Phase retrieval by iterated projections [J].

Elser, V .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2003, 20 (01) :40-55

[10] Strategies for processing diffraction data from randomly oriented particles [J].

Elser, Veit .

ULTRAMICROSCOPY, 2011, 111 (07) :788-792

← 1 2 3 4 →